Defect annihilation dynamic in Switching ON-OFF
for 4D Twisted Nematic devices
Dynamic of annihilation of disclination lines for
Vz< V_crit
(unstable situation) : first pathway
Abulk=0.1 L1=0.04
L2=0.04 with pretilt =10)
Dynamic of annihilation of disclination lines for Vz< V_crit
 
 
 
when 4DTN is unstable : second pathway
Abulk=0.1 L1=0.04
L2=0.04, pretilt =10